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Tle5010 Sensor De Angulo  Magnetoresistivo Soic8  Itytarg Ver más grande

Tle5010 Sensor De Angulo Magnetoresistivo Soic8 Itytarg

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 Features


• Giant Magneto Resistance (GMR)-based principle
• Integrated magnetic field sensing for angle
measurement
• Full 0 - 360° angle measurement
• Highly accurate single bit SD-ADC
• 16 bit representation of sine / cosine values on the
interface
• Bi-directional SSC Interface up to 2 Mbit/s
• 3-pin SSC Interface, SPI compatible with open drain
• ADCs and filters are synchronized with external commands via SSC
• Test resistors for simulating angle values
• Core supply voltage 2.5 V
• 0.25 µm CMOS technology
• Automotive qualified: -40°C to +150°C (Junction Temperature)
• Latch up immunity according JEDEC standard
• ESD > 2 kV (HBM)
• Green package with lead-free (Pb-free) plating

Target Applications


The TLE5010 GMR-Based Angular Sensor is designed for angular position sensing in
automotive applications, such as:
• Steering Angle
• Brushless DC Motor Commutation (e.g. EPS)
• Rotary Switch
• General Angular Sensing

Product Description
The TLE5010 is a 360° angle sensor that detects the orientation of a magnetic field. This
is achieved by measuring sine and cosine angle components with monolithic integrated
Giant Magneto Resistance (GMR) elements.
Data communications are accomplished with a bi-directional SSC Interface that is SPI
compatible.


The sine and cosine values can be read out. These signals can be digitally processed to
calculate the angle orientation of the magnetic field (magnet). This calculation can be
done by using a cordic algorithm.
It is possible to connect more than one TLE5010 to one SSC Interface of a
microcontroller for redundancy or any other reasons. If multiple TLE5010 devices are
used, the synchronization of the connected TLE5010 is performed by a broadcast
command. Each connected TLE5010 can be addressed by a dedicated Chip Select (CS)
pin.
Online diagnostic functions are provided to ensure reliable operation.


These diagnostics are
• Angle test (generated via test voltages feeding the ADC).
• Crossed signal paths (switchable for comparison)
• Inverted signs of bit streams
• Overvoltage and undervoltage detections

http://static6.arrow.com/aropdfconversion/8b0dd5185ea080c3168cf0e523144274b37465e3/tle5010_preliminary_data_sheet_v0.9_draft.pdf

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